Pre-owned Semiconductor Equipment Trading Platform | semicn.com
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SEMICN is the world's leading second-hand semiconductor equipment trading platform, providing a transparent and efficient trading experience for both buyers and sellers.

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Pre-owned Semiconductor Equipment Trading Platform | semicn.com
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Cleaning Diffusion & Oxidation Lithography & Coater-Developer Etch Deposition Ion Implantation CMP Equipment Metrology & Inspection Wafer Test / Circuit Probe Wafer Thinning & Dicing Bonding & Mounting Post-package Processing Wafer Transfer System Vacuum & Exhaust Treatment Fluid Supply
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1980 2026

Showing 1067 results

10 hours ago

计量检测

HS-830

Metrology & Inspection

TORAY

Location:国外

Year: 2010

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Verified
10 hours ago

薄膜分析设备

JVX6200i

Metrology & Inspection

Jordan Valley

Location:国外

Year: 2011

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Verified
10 hours ago

光学显微镜

Polyvar +AL100

Metrology & Inspection

Olympus

Location:国内

Year: --

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10 hours ago

光学显微镜

Optiphot300

Metrology & Inspection

NIKON

Location:国内

Year: --

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Verified
10 hours ago

脉冲信号发生器

81110A

Metrology & Inspection

Agilent

Location:国外

Year: --

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Verified
10 hours ago

扫描电子显微镜

JWS-7555

Metrology & Inspection

JEOL

Location:国外

Year: 2002

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Verified
10 hours ago

检测设备

SPVCMS4000

Metrology & Inspection

Semilab

Location:国外

Year: 1995

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Verified
10 hours ago

薄膜测量系统

Polylite 88

Metrology & Inspection

KLA

Location:国外

Year: --

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Verified
10 hours ago

扫描电子显微镜

JWS-7515

Metrology & Inspection

JEOL

Location:国外

Year: 1999

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Verified
10 hours ago

晶圆检测设备

PEGSIS P100

Metrology & Inspection

LASERTEC

Location:国外

Year: 2011

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Verified
10 hours ago

扫描电子显微镜

S5000

Metrology & Inspection

HITACHI

Location:国外

Year: 1997

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Verified
10 hours ago

晶圆载台控制器

CRS1010

Metrology & Inspection

KLA

Location:国外

Year: 1998

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Verified
10 hours ago

光检查系统

XSCAN-A130H

Metrology & Inspection

XAVIS

Location:国内

Year: --

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Verified
10 hours ago

计数器

Lasair 110

Metrology & Inspection

PMS

Location:国外

Year: 2013

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Verified
10 hours ago

晶圆厚度量测仪

UMA-200-BP

Metrology & Inspection

MicroSense

Location:国内

Year: --

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10 hours ago

薄膜厚度测量仪

TWI-OP5×40

Metrology & Inspection

NIHON DENSAN

Location:国内

Year: --

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10 hours ago

薄膜计量设备

V220SI

Metrology & Inspection

VEECO

Location:国外

Year: --

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10 hours ago

检测设备

PDS-100

Metrology & Inspection

VLSI Standard

Location:国外

Year: 2000

Contact for Price

Verified
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Pre-owned Semiconductor Equipment Trading Platform | semicn.com

4009 Banister Ln Suite 412,

 

Austin, TX 78704

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