Pre-owned Semiconductor Equipment Trading Platform | semicn.com
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SEMICN is the world's leading second-hand semiconductor equipment trading platform, providing a transparent and efficient trading experience for both buyers and sellers.

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Pre-owned Semiconductor Equipment Trading Platform | semicn.com
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Cleaning Diffusion & Oxidation Lithography & Coater-Developer Etch Deposition Ion Implantation CMP Equipment Metrology & Inspection Wafer Test / Circuit Probe Wafer Thinning & Dicing Bonding & Mounting Post-package Processing Wafer Transfer System Vacuum & Exhaust Treatment Fluid Supply
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1980 2026

Showing 1067 results

10 hours ago

扫描电子显微镜

CG-4000

Metrology & Inspection

HITACHI

Location:国外

Year: --

Contact for Price

Verified
10 hours ago

分光测色仪

C-600

Metrology & Inspection

UVP

Location:国外

Year: 2001

Contact for Price

Verified
10 hours ago

小型高温试验箱

ST-120

Metrology & Inspection

ESPEC

Location:国外

Year: 1998

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Verified
10 hours ago

参数量测设备

SX141

Metrology & Inspection

Synax

Location:国外

Year: 2005

Contact for Price

Verified
10 hours ago

光谱仪

AANALYST 600

Metrology & Inspection

Perkin Elmer

Location:国外

Year: 2002

Contact for Price

Verified
10 hours ago

分析系统

CLM 3D

Metrology & Inspection

FEI

Location:国外

Year: 2011

Contact for Price

Verified
10 hours ago

原子力显微镜

Dimension X3D

Metrology & Inspection

VEECO

Location:国外

Year: 2006

Contact for Price

Verified
10 hours ago

射线荧光光谱仪

3272

Metrology & Inspection

RIGAKU

Location:国外

Year: 2005

Contact for Price

Verified
10 hours ago

光学计量系统

T600

Metrology & Inspection

Nova

Location:国外

Year: 2014

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Verified
10 hours ago

光刻测量设备

Caliper

Metrology & Inspection

Nanometrics

Location:国外

Year: 2001

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Verified
10 hours ago

光学测量仪

AQ2140

Metrology & Inspection

ANDO

Location:国内

Year: --

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Verified
10 hours ago

测量仪

BedeMetrix-F

Metrology & Inspection

Jordan Valley

Location:国外

Year: 2006

Contact for Price

Verified
10 hours ago

缺陷自动检测仪器

SEMVISION

Metrology & Inspection

AMAT

Location:国内

Year: --

Contact for Price

Verified
10 hours ago

电子束器件分析设备

XPEQT EM

Metrology & Inspection

Chiron

Location:国外

Year: 2002

Contact for Price

Verified
10 hours ago

电子束检测分析设备

DESTIN EM

Metrology & Inspection

Chiron

Location:国外

Year: 2000

Contact for Price

Verified
10 hours ago

影像检测系统

micromex 160

Metrology & Inspection

Phoenix

Location:国外

Year: 2007

Contact for Price

Verified
10 hours ago

薄膜测量设备

S3000SX

Metrology & Inspection

Rudolph

Location:国外

Year: 2011

Contact for Price

Verified
10 hours ago

薄膜测量设备

S3000S

Metrology & Inspection

Rudolph

Location:国外

Year: 2011

Contact for Price

Verified
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Pre-owned Semiconductor Equipment Trading Platform | semicn.com

4009 Banister Ln Suite 412,

 

Austin, TX 78704

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