Pre-owned Semiconductor Equipment Trading Platform | semicn.com
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Pre-owned Semiconductor Equipment Trading Platform | semicn.com
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Cleaning Diffusion & Oxidation Lithography & Coater-Developer Etch Deposition Ion Implantation CMP Equipment Metrology & Inspection Wafer Test / Circuit Probe Wafer Thinning & Dicing Bonding & Mounting Post-package Processing Wafer Transfer System Vacuum & Exhaust Treatment Fluid Supply
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Showing 1067 results

10 hours ago

原子力显微镜

Insight 3D

Metrology & Inspection

Bruker

Location:国外

Year: 2017

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Verified
10 hours ago

薄膜测量分析设备

PS-2000

Metrology & Inspection

Semilab

Location:国外

Year: 2015

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Verified
10 hours ago

显微镜

PMG3

Metrology & Inspection

OLYMPUS奥林巴斯

Location:国外

Year: --

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10 hours ago

能谱仪

X- ACT

Metrology & Inspection

Camtek

Location:国外

Year: 2012

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Verified
10 hours ago

测量设备

RSR160

Metrology & Inspection

RORZE

Location:国外

Year: 2017

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Verified
10 hours ago

光谱仪

Q200I

Metrology & Inspection

Nanometrics

Location:国外

Year: 2002

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Verified
10 hours ago

光学检测计量设备

UVision 5

Metrology & Inspection

AMAT

Location:国外

Year: 2011

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Verified
10 hours ago

图示仪

TCT-2004

Metrology & Inspection

KDK

Location:国内

Year: --

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10 hours ago

显微镜

Holographic Microscope

Metrology & Inspection

LYNCEE TEC

Location:国外

Year: 2012

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Verified
10 hours ago

射线计量设备

JVX7300

Metrology & Inspection

Jordan Valley

Location:国外

Year: 2012

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Verified
10 hours ago

电子束检测设备

eP4

Metrology & Inspection

Hermes

Location:国外

Year: 2017

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Verified
10 hours ago

激光扫描发射系统

300 TDE

Metrology & Inspection

CHECKPOINT

Location:国外

Year: 2011

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Verified
10 hours ago

分析设备

P13010

Metrology & Inspection

ANCOSYS

Location:国外

Year: 2011

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Verified
10 hours ago

电子显微镜

1030

Metrology & Inspection

E.A. Fischione

Location:国外

Year: 2005

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Verified
10 hours ago

透射电子显微镜

ARM200CF Super X

Metrology & Inspection

JEOL

Location:国外

Year: 2014

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Verified
10 hours ago

晶圆检测测量

ExSolve 2 WTP EFEM

Metrology & Inspection

FEI

Location:国外

Year: 2017

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Verified
10 hours ago

扫描电子显微镜

LEA1530

Metrology & Inspection

Carl Zeiss

Location:国外

Year: 2002

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Verified
10 hours ago

电子显微镜

HF-2000

Metrology & Inspection

HITACHI

Location:国外

Year: 1995

Contact for Price

Verified
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Pre-owned Semiconductor Equipment Trading Platform | semicn.com

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